Effect of Impurity Clusters on Optical Properties of Nickel and Copper Doped Single-Crystal Silicon

Keywords: Silicon, Nickel, Copper, Diffusion, Impurity, Oxygen, Carbon, Clusters

Abstract

This paper deals with the influence of impurity atoms on the optical properties of single-crystal silicon doped with nickel and copper during high-temperature diffusion doping. And also, the processes of formation of various chemical compounds involving oxygen, carbon, and atoms of nickel, copper, and silicon. By means of FTIR spectrometry and X-ray diffraction analysis, it was revealed that the concentrations of optically active oxygen and carbon in the volume of silicon samples doped with nickel and copper significantly increase compared to the original samples.

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References

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Published
2026-03-14
Cited
How to Cite
Zainabidinov, S. Z., Turgunov, N., Boboev, A. Y., Akbarov, S. K., Turmanova, R. M., Arikov, A., Kuchkarova, M. O., Tolanova, B., & Rasulova, M. B. (2026). Effect of Impurity Clusters on Optical Properties of Nickel and Copper Doped Single-Crystal Silicon. East European Journal of Physics, (1), 203-207. https://doi.org/10.26565/2312-4334-2026-1-20

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