Effect of Impurity Clusters on Optical Properties of Nickel and Copper Doped Single-Crystal Silicon
Abstract
This paper deals with the influence of impurity atoms on the optical properties of single-crystal silicon doped with nickel and copper during high-temperature diffusion doping. And also, the processes of formation of various chemical compounds involving oxygen, carbon, and atoms of nickel, copper, and silicon. By means of FTIR spectrometry and X-ray diffraction analysis, it was revealed that the concentrations of optically active oxygen and carbon in the volume of silicon samples doped with nickel and copper significantly increase compared to the original samples.
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S.Z. Zainabidinov, Sh.K. Akbarov, N.A. Turgunov, N.B. Khaytimmetov, and R.M. Turmanova, “Formation of impurity accumulations in silicon doped with nickel and copper,” E3S Web of Conferences, 632, 03004 (2025). https://doi.org/10.1051/e3sconf/202563203004
S.Z. Zaynabidinov, A.Y. Boboev, N.Y. Yunusaliyev, and M.B. Rasulova, “X-ray diffraction analysis, optical characteristics and electro-physical properties of the n-ZnO/p-NiO structure grown by the spray pyrolysis method,” New Materials, Compounds and Applications, 8(3), 411–421 (2024). https://doi.org/10.62476/nmca83411
B. Talanin and I. Talanin, “High-temperature precipitation of impurities in metals,” Physics of the Solid State, 64(3), 340–346 (2022). https://doi.org/10.1134/S1063783422030270.
G. Kissinger, D. Kot, F. Bärwolf, M. Lisker, “Investigation of the Impact of Amorphous Silicon Layers Deposited by PECVD and HDP-CVD on Oxide Precipitation in Silicon,” Materials Science in Semiconductor Processing, 164, 107614 (2023). https://doi.org/10.1016/j.mssp.2023.107614
N.A. Turgunov, E.Kh. Berkinov, and R.M. Turmanova, “Accumulations of impurity Ni atoms and their effect on the electrophysical properties of Si,” E3S Web of Conferences, 402, 14018 (2023).
N.A. Turgunov, S.K. Akbarov, N.B. Khaytimmetov, and R.M. Turmanova, “Influence of accumulation of impurity atoms Ni and Fe on the electrophysical properties of Si single crystals,” J. Nano Electron. Phys. 16(1), 01004 (2024). https://doi.org/10.21272/jnep.16(1).01004
D. Firsov, S. Khakhulin, and O. Komkov, “Fourier-transform infrared reflection anisotropy spectroscopy of semiconductor crystals and structures: Development and application in the mid-infrared,” Appl. Spectrosc. 1(4), 1–12 (2023).
Y. Yamashita, et al., “Effect of metal impurities on recombination lifetime in Si,” J. Appl. Phys. 127, 075701 (2020). https://doi.org/10.1063/1.5140424
A. Liebendorfer, “Advances in vibrational spectroscopy provide new ways for characterizing semiconductor impurities,” Scilight, 2018(2), 020002 (2018). https://doi.org/10.1063/1.5021599
M. Fahelelbom, A. Saleh, M. M. A. Al Tabakha, and A. A. Ashames, “Recent applications of quantitative analytical FTIR spectroscopy in pharmaceutical, biomedical, and clinical fields: A brief review,” Rev. Anal. Chem. 41(1), 21–33 (2022). https://doi.org/10.1515/revac-2022-0030
A.Y. Boboev, B.M. Ergashev, N.Y. Yunusaliyev, M.M. Xotamov, “Study of the formation of low-dimensional defect states in single-crystal silicon with the participation of oxygen,” East Eur. J. Phys. (2), 292 (2025), https://doi.org/10.26565/2312-4334-2025-2-36
J.H. Linn, and K.L. Hanley, “Quantitative infrared spectroscopy of interstitial oxygen in silicon wafers using multivariate calibration,” Applied Spectroscopy, 47(12), 2102–2107 (1993). https://doi.org/10.1366/0003702934066361
N.Y. Yunusaliyev, “The gas-sensitive properties of tin dioxide films” East Eur. J. Phys. (4), 439 (2024), https://doi.org/10.26565/2312-4334-2024-4-5
A. Janotti, and C.G. Van de Walle, “Fundamentals of zinc oxide as a semiconductor,” Reports on Progress in Physics, 72(12), 126501 (2009). https://doi.org/10.1088/0034-4885/72/12/126501
S. Zaynabidinov, et al., “X-ray diffraction and electron microscopic studies of the ZnO(S) metal oxide films obtained by the ultrasonic spray pyrolysis method,” Herald of the Bauman Moscow State Tech. Univ. Ser. Nat. Sci. 1, 78 (2024). https://doi.org/10.18698/1812-3368-2024-1-78-92
M. Kooti, and M. Jorfi, “Synthesis and characterization of nanosized NiO₂ and NiO using Triton X-100,” Open Chemistry, 6(1), 186–192 (2008). https://doi.org/10.2478/s11532-008-0005-9
Copyright (c) 2025 Sirajidin Z. Zainabidinov, N.A. Turgunov, Akramjon Y. Boboev, Shuhratjon K. Akbarov, Raymash M. Turmanova, Abdukakhor Arikov, Muqaddas O. Kuchkarova, Bakhrikhon Tolanova, Markhabo B. Rasulova

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