Iliyev, Xalmurat M., Tashkent State Technical University, Tashkent, Uzbekistan, Uzbekistan

• East European Journal of Physics No. 3 (2023): East European Journal of Physics - Original Papers
  X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique
  Abstract  pdf
• East European Journal of Physics No. 2 (2024): East European Journal of Physics - Original Papers
  Electrodifusion of Manganese Atoms in Silicon
  Abstract  pdf