Analisys of synthesis condition of hard tantalum diboride coatings in magnetron sputtering systems

  • А. А. Гончаров Сумской государственный университет
  • А. Н. Юнда Сумской государственный университет
  • А. В. Зыков Харьковский национальный университет имени В.Н. Каразина
  • В. И. Фареник Научный физико-технологический центр МОН и НАН Украины, Харьков
  • И. В. Шелест Сумской государственный университет
  • В. В. Буранич Сумской государственный университет
Keywords: magnetron sputtering systems, tantalum diboride films, deposition conditions, structure, bias potential

Abstract

Study of the synthesis parameters of tantalum diboride thin films obtained in RF and DC magnetron sputtering systems was carried out in this paper. A comparative analysis of the synthesis energy conditions of these films was performed. It was shown that the amount, energy of the ions and neutral particles, participating in the deposition and formation of film on the surface of substrate, changes significantly depending on the method (RF or DC) used for film obtaining, which leads to the formation of coatings in different structural states from an amorphous to nanocrystalline with growth texture perpendicular to the plane (00.1).

 

 

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Author Biographies

А. А. Гончаров, Сумской государственный университет
с.н.с.
А. Н. Юнда, Сумской государственный университет
с.н.с.
А. В. Зыков, Харьковский национальный университет имени В.Н. Каразина
с.н.с.
В. И. Фареник, Научный физико-технологический центр МОН и НАН Украины, Харьков
с.н.с.
И. В. Шелест, Сумской государственный университет
с.н.с.
В. В. Буранич, Сумской государственный университет
с.н.с.

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Published
2017-11-14
How to Cite
Гончаров, А. А., Юнда, А. Н., Зыков, А. В., Фареник, В. И., Шелест, И. В., & Буранич, В. В. (2017). Analisys of synthesis condition of hard tantalum diboride coatings in magnetron sputtering systems. Journal of Surface Physics and Engineering, 2(2-3), 105- 114. Retrieved from https://periodicals.karazin.ua/pse/article/view/9573