Structural, Dielectric and Magnetic Properties of Epitaxial Grown YMn0.5Cr0.5O3 thin films

  • A. Rambabu Department of Basic Sciences and Humanities, GMR Institute of Technology, Rajam, Andhra Pradesh, India https://orcid.org/0000-0001-5562-3334
  • G. Jeevana Mounika Department of Physics, Government Degree College, Chintalapudi, Eluru, Andhra Pradesh, India https://orcid.org/0009-0002-1854-5941
  • K. Jayadev Department of Physics, P. R Government College (A), Kakinada, Andhra Pradesh, India
  • B. Sridhar Department of Physics, RGUKT Srikakulam, Andhra Pradesh, India
DOI: https://doi.org/10.26565/2312-4334-2024-4-28
Keywords: Thin films, Multiferroics, Dielectric properties, Magnetic properties

Abstract

YCr(1-x)MnxO3 is an intriguing member of the perovskite family, attracting significant interest due to its versatile properties and potential applications in various fields. Epitaxial orthorhombic YMn0.5Cr0.5O3 films are grown on STO substrates by pulsed laser deposition method. Well crystalline with (0 ℓ 0) orientation of YMn0.5Cr0.5O3 films are identified by X-ray diffraction. Field emission scanning electron microscopy used to capture the morphological behavior of crystalline YMn0.5Cr0.5O3 films. Temperature-dependent dielectric properties are analyzed thoroughly. The magnetic properties of YMn0.5Cr0.5O3 films are characterized using physical property measurement system. There is a clear magnetic transition observed around 60K for three YMn0.5Cr0.5O3 films. Films deposited at 600oC exhibited high dielectric and magnetic properties.

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Published
2024-12-08
Cited
How to Cite
Rambabu, A., Mounika, G. J., Jayadev, K., & Sridhar, B. (2024). Structural, Dielectric and Magnetic Properties of Epitaxial Grown YMn0.5Cr0.5O3 thin films. East European Journal of Physics, (4), 274-278. https://doi.org/10.26565/2312-4334-2024-4-28
Issue
No. 4 (2024): East European Journal of Physics
Section
Original Papers

Copyright (c) 2024 A. Rambabu, G. Jeevana Mounika, K. Jayadev, B. Sridhar

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