Daliev, Shakhrukh Kh., Institute of Semiconductor Physics and Microelectronics of National University of Uzbekistan, Tashkent, Uzbekistan, Uzbekistan
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East European Journal of Physics No. 3 (2023): East European Journal of Physics - Original Papers
Investigation of Defect Formation in Silicon Doped with Silver and Gadolinium Impurities by Raman Scattering Spectroscopy
Abstract pdf