Daliev, Shakhrukh Kh., Institute of Semiconductor Physics and Microelectronics at the National University of Uzbekistan, Tashkent, Uzbekistan, Uzbekistan

• East European Journal of Physics No. 4 (2023): East European Journal of Physics - Original Papers
  On the Properties of the Si-SiO2 Transition Layer in Multilayer Silicon Structures
  Abstract  pdf
• East European Journal of Physics No. 3 (2023): East European Journal of Physics - Original Papers
  Effect of the Diffusion of Copper Atoms in Polycrystalline CdTe Films Doped with Pb Atoms
  Abstract  pdf
• East European Journal of Physics No. 4 (2023): East European Journal of Physics - Original Papers
  Capacitive Spectroscopy of Deep Levels in Silicon with Samarium Impurity
  Abstract  pdf