Berkinov, Elmurod Kh., Institute of Semiconductor Physics and Microelectronics at the National University of Uzbekistan, Tashkent, Uzbekistan, Uzbekistan

• East European Journal of Physics No. 3 (2023): East European Journal of Physics - Original Papers
  The Effect of Thermal Annealing on the Electrophysical Properties of Samples n-Si
  Abstract  pdf