Naurzalieva, Elmira M., Institute of Semiconductor Physics and Microelectronics of National University of Uzbekistan, Tashkent, Uzbekistan, Uzbekistan

• East European Journal of Physics No. 3 (2023): East European Journal of Physics - Original Papers
  Investigation of Defect Formation in Silicon Doped with Silver and Gadolinium Impurities by Raman Scattering Spectroscopy
  Abstract  pdf