Effectiveness of Wavelet Denoising on Secondary Ion Mass Spectrometry Signals
Abstract
Wavelet theory has already achieved huge success. For Secondary Ions Mass Spectrometry (SIMS) signals, denoising the secondary signal, which is altered by the measurement, is considered that an essential step prior to applying such a signal processing technique that aims enhance the SIMS signals.The most efficient and widely used wavelet denoising method is based on wavelet coefficient thresholding. This process involves three important steps; wavelet decomposition: the input signals are decomposed into wavelet coefficients, thresholding: the wavelet coefficients are modified according to a threshold, and reconstruction: the modified coefficients are used in an inverse transform to obtain the noise-free-signal. Several researchers have used thresholding wavelet denoising techniques.
The choice of wavelet type and the level of resolution can have a significant influence; it is important to note that the choice of resolution level depends on the type of signal we are dealing with, the nature of the present noise, and our specific goals for the denoised signal. It is generally recommended to test different resolution levels and evaluate their impact on the quality of the denoised signal before making a final decision. Moreover, the results obtained in wavelet denoising can be significantly influenced by the selection of wavelet types. The chosen wavelet type plays a crucial role in the extraction of signal details. Indeed, the effectiveness of denoising the MD6 sample has been demonstrated by the results obtained with sym4, db8, Haar and coif5 wavelets? These wavelets have effectively reduced noise while preserving crucial signal information, leading to an enhancement in the quality of the denoised signal.
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