Photosensitivity and current flow mechanism in p-CdTe-SiO2-Si heterostructures with deep impurity levels
Keywords:
picosecond photoconductivity, semiconductor film, recombination, generation, photovoltage, photosensitivity
Abstract
The photosensitivity and the current flow mechanism in low-dimensional p-CdTe-SiO2-Si heterostructures with deep impurity levels are studied. A picosecond photoconductivity was detected, which indicates the presence of a large concentration of surface recombination centers in CdTe films.
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References
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Published
2017-07-19
How to Cite
Жураев, Н., Халилов, М., Отажонов, С., & Алимов, Н. (2017). Photosensitivity and current flow mechanism in p-CdTe-SiO2-Si heterostructures with deep impurity levels. Journal of Surface Physics and Engineering, 2(1), 26 - 29. Retrieved from https://periodicals.karazin.ua/pse/article/view/8738
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