APPLICATION OF 4He2+ AND 3He2+ BEAMS OF THE COMPACT ACCELERATOR “SOKOL” FOR ION BEAM ANALYSIS

  • S. G. Karpus National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine
  • V. N. Bondarenko National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine
  • A. V. Goncharov National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine
  • L. S. Glazunov National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine
  • A. V. Zats National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine
  • V. V. Kuz’menko National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine
  • V. M. Pistryak National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine
  • V. I. Sukhostavets National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine

Abstract

Some planar structures have been studied by 4Не2+ ion beam and the backscattering spectrometry. Thicknesses of separate layers were determined in the optical coating consist of 13 alternated Ta2O5 and SiO2 layers on the SiO2 substrate. Oxygen fraction was measured in VN coating formed by ion beam assisted deposition technique (IBAD) and in Nb2O5 coating deposited by laser sputtering. Besides deuterium concentration distribution in titanium deuteride layer on Mo substrate was measured by 3Не2+ ion beam and the D(3He,p)4He nuclear reaction.

Downloads

Download data is not yet available.

Author Biography

S. G. Karpus, National Scientific Center “Kharkov Institute of Physics and Technology” 1, Akademicheskaya st., Kharkov 61108, Ukraine

References

Heinicke E., Hellebold J.M., Weber A. Preliminary results with a Penning ion source on a 5.5 MV Van de Graaff accelerator // Nucl. Instrum. and Meth. - 1975. - Vol.124. - P.301-303.

Mistra S.N., Gupta S.K., Mehta M.K. Installation of pre-injection ion source-Z/M analyzer system on the 5.5 MV Van de Graaff accelerator at Trombay // Nucl. Instrum. and Meth. - 1976. - Vol.135. - P.477-481.

Grimshaw J.A. Use of 3He++ in RBS analysis of CMT and related epilayers // Vacuum. - 1984. - Vol.24. – No.12. - P.1097-1098.

Bartha L., Kiss A.Z., Koltay E., Szabo Gy. Light heavy-ion and molecular beams from a radio-frequency ion source // Nucl. Instrum. and Meth.-1990.-Vol.A287.-P.156-160.

Towle J.H., Howe F.A., James G. Production of a nanosecond-pulsed He++ beam from a 5.5 MV Van de Graaff // Nucl. Instrum. and Meth. - 1968. - Vol.62. - P.77-81.

Batvinov L.P., Vergunov A.D., Glazunov L.S., Zac A.V., Levchenko Ju.Z., Novikov M.T., Pistrjak V.M., Storizhko V.E., Chekanov S.Ja. Malogabaritnyj elektrostaticheskij uskoritel' na 2 MjeV gorizontal'nogo tipa (predvaritel'nye ispytanija) // Voprosy atomnoj nauki i tehniki. Serija: Tehnika fizicheskogo eksperimenta. - Moskva. - CNIIatominform. - 1985. - Vyp.1(22). - S.26-28.

Glazunov L.S., Zats A.V., Karpus S.G., Kuz’menko V.V., Pistryak V.M. Multi-charged ion source // Problems of Atomic Science and Technology, Series “Nuclear Physics Investigations” (55). - 2011. – No.3(73). - P.68-74.

Komarov F.F., Kumahov M.A., Tashlykov I.S. Nerazrushajushhij analiz poverhnostej tverdyh tel ionnymi puchkami. -Minsk: Izd-vo “Universitetskoe”, 1987. - 256s.

Feldman L., Majer D. Osnovy analiza poverhnosti i tonkih plenok. - M.: Mir, 1989. - 342 s.

Tesmer J.R., Nastasi M. (Eds.) Handbook of Modern Ion Beam Materials Analysis. MRS-Materials research Society. Pittsburgh, PA, 1995. - 704 p.

Malmqvist K.G. Accelerator-based ion beam analysis – an overview and prospects // Radiat. Phys. Chem. - 2004. - Vol.71. - P.817-827.

Roberson N.R., Tilley D.R., Weller H.R. The acceleration of doubly-ionized He3* // Nucl. Instrum. and Meth. - 1965. - Vol.33. - P.84-86.

Karpus S.G., Goncharov A.V., Pistryak V.M., Zats A.V., Kuz’menko V.V., Bondarenko V.N., Sukhostavets V.I., Glazunov L.S. 4He2+ and H2

+ ion beam separation on “Sokol” IBA facility // Problems of Atomic Science and Technology, Series “Nuclear Physics Investigations” (64). - 2015. – No.3(97). - P.95-98.

Parmentier R., Lemarchand F., Cathelinaud M., Lequime M., Amra C., Labat S., Bozzo S., Bocqet F., Charaf A,, Tomas O., Dominici C. Piezoelectric tantalum pentoxide studied for optical tunable applications // Appl. Opt.-2002. - Vol.41. - No.16. - P.3270-3276.

Yoon S.G., Kang S.M., Yoon D.H. Residual stress and optical properties in a past-annealed Ta2O5/SiO2 multilayer prepared by using dual-ion-beam sputtering // J. Korean Phys. Soc. - 2006. - Vol.49. – No.1. - P.237-240.

Leavitt J.A., McIntyre L.C., Ashbaugh M.D., Oder J.G., Lin Z., Dezfouly-Arjomondy B. Cross sections for 170.50 backscattering of 4He from oxygen for 4He energies between 1.8 and 5.0 MeV // Nucl. Instrum. and Meth. - 1990. - Vol.B44. -P.260-265.

Andersen H.H., Besenbacher F., Loftager P., Moller W. Large-angle scattering of light ions in the weakly screened Rutherford region // Phys. Rev. - 1980. - Vol.21. - P.1891-1901.

Сuomo J.J., Rossnagel S.M. Property modification and synthesis by low energy particle bombardment concurrent with film growth // Nucl. Instr. and Meth. - 1987. - Vol.B19/20. - P.963-974.

Smidt F.A. Use of ion beam assisted deposition to modify the microstructure and properties of thin films // International Materials Reviews. - 1990. - Vol.35. - No.2. - P.61-128.

Vasilenko R.L., Goncharov A.V., Guglja A.G., Karpus' S.G., Litvinenko M.A. O mehanizme formirovanija VN pokrytij v uslovijah bombardirovki ionami azota // Poverhnost'. Rentgenovskie, sinhrotronnye i nejtronnye issledovanija. - 2008. – No.11. - S.81-87.

Goncharov A., Guglya A., Melnikova E. On the feasibility of developing hydrogen storage capable of adsorption hydrogen both in its molecular and atomic states // International journal of hydrogen energy. - 2012. - Vol.37. - Iss.23. - P.18061-18073.

Tolenis T., Gaspariunas M., Lelis M., Plukis A., Buzelis R., Melninkaitis A. Assessment of effective-medium theories of ionbeam sputtered Nb2O5-SiO2 and ZrO2-SiO2 mixtures // Lith. J. Phys. - 2014. - Vol.54. - No.2. - P.99-105.

Mezey G., Kotal E., Revesz P., Manuaba A., Lohner T., Gyulai J., Fried M., Vizkelethy Gy., Paszti F., Battistig G., Somogyi M. Enhanced sensitivity of oxygen detection of 3.045 MeV (α,α) elastic scattering and its applications // Acta Phys. Hung. - 1985. - Vol.58. - P.39-55.

Rubel M., Wienhold P., Hildebrandt D. Ion beam analysis methods in the studies of plasma facing materials in controlled fusion devices // Vacuum. - 2003. - Vol.70. - P.423-428.

Ziegler J.F. SRIM program. Available from: http://www.srim.org/.

Antonova M.M. Svojstva gidridov metallov. - Kiev: Naukova dumka, 1975. - 128 s.

Published
2015-09-22
Cited
0 article
How to Cite
Karpus, S., Bondarenko, V., Goncharov, A., Glazunov, L., Zats, A., Kuz’menko, V., Pistryak, V., & Sukhostavets, V. (2015). APPLICATION OF 4He2+ AND 3He2+ BEAMS OF THE COMPACT ACCELERATOR “SOKOL” FOR ION BEAM ANALYSIS. East European Journal of Physics, 2(2), 90-98. https://doi.org/10.26565/2312-4334-2015-2-10