Investigation of Ar+ Ions Scattering from the Surface of CdTe(001) <110> at the Glancing Incidence
Abstract
This article presents the results of ion scattering from the surface of a thin film of CdTe (001) < 110>, obtained using ion stripping spectroscopy. The trajectories of scattered Ar+ ions were obtained and analyzed. with an initial energy of 1 keV and at angles of incidence y=3° and 7°. It is shown that the trajectories of scattered ions from the surface atomic row, from the wall of the semichannel and from the bottom of the semichannel differ from each other. The first trajectories of scattered ions from a surface semichannel consisting of five Cd and Te atoms arranged layer-by-layer in two layers were obtained. The shapes of these three types of trajectories are discussed and the energies, scattering coefficients, and inelastic energy losses of the scattered ions are calculated. It is shown that the energy values, scattering coefficient and inelastic energy losses of scattered ions from surface atomic rows differ little from each other. For ions scattered from the wall of the semichannel and from the bottom of the semichannel, the values of these parameters lie in the range.
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