Wavelet analysis of composition microinhomogeneities of Cd1-xZnxTe crystals grown from melt
Keywords:
AIIBVI crystals, dielectric permittivity, semiconductors solid solutions, composition inhomogeneities, wavelet analysisAbstract
Linear dependencies of composition of Cd1-xZnxTe (x = 0.03 - 0.15) crystals grown from melt were measured along direction of its growth. Wavelet analysis shows that in these dependences for Zn mole fraction corresponding to different sections there are several harmonic components with spatial period about units – tens micrometers. Anisotropy of low-frequency dielectric properties on crystals where specified direction is physically marked out was revealed. Peculiarities of crystal composition and properties are explained with self-oscillating processes at their growth.
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2015-07-01
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Wavelet analysis of composition microinhomogeneities of Cd1-xZnxTe crystals grown from melt. (2015). Journal of V. N. Karazin Kharkiv National University. Series Physics, 1158(22), 13-17. https://periodicals.karazin.ua/physics/article/view/7793




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