Тhe temperature dependence of the reverse branch of the CVC Al-p-CdTe-Mo structure

Abstract

The results of investigations voltage characteristic structure of Al-p-CdTe-Mo with an extended base (w = 120 μm), depending on the temperature. It is shown that such a structure has an extended sublinear portion of high value on the reverse current-voltage characteristic, which is almost does not change its shape at temperatures of 173–373 K. The results are explained in terms of the diffusion and drift mechanisms of current transport takes into account the possibility of exchanging free carrier recombination inside the complex.