Supercooling during the crystallization of the liquid phase of the fusible component in multilayer films with different nature of contact pairs interaction

Abstract

The study of supercooling during the crystallization of the liquid phase of tin and indium in multi layer films based on copper and molybdenum has been carried out. Using the in situ method of measuring the electrical resistance, the values of supercooling have been determined in the given systems. It is shown that the electrical resistance measurement method is sensitive to many processes occurring in multilayered binary systems, however, a reliable determination of phase transition temperature melting-crystallization is possible only for the contact pairs with a simple type of interaction and the absence of chemical compounds.