The influence of the magnetron sputtering regime and the composition of the reaction gas on the structure and properties of ITO films

Authors

  • А. И. Бажин Донецкий национальный университет
  • А. Н. Троцан Донецкий национальный университет
  • С. В. Чертопалов Донецкий национальный университет
  • А. А. Стипаненко Донецкий национальный университет
  • В. А. Ступак Донецкий национальный университет

Keywords:

ITO films, magnetron sputtering, preferred orientation, electrical resistance, transparency, band energy gap

Abstract

The influence of substrate temperature, composition of the working gas and DC and MF modes of reactive magnetron sputtering of an alloy 90%In + 10%Sn on the structural state, electrical resistance, transparency, and the band gap of the films ITO, deposited on glass substrates have been studied. The dependence of electron-optical properties of ITO films on the conditions of their production explains by the influence of the relaxation of internal stresses and crystallinity.

 

 

Author Biographies

  • А. И. Бажин, Донецкий национальный университет
    с.н.с.
  • А. Н. Троцан, Донецкий национальный университет
    с.н.с.
  • С. В. Чертопалов, Донецкий национальный университет
    с.н.с.
  • А. А. Стипаненко, Донецкий национальный университет
    с.н.с.
  • В. А. Ступак, Донецкий национальный университет
    с.н.с.

Published

2012-10-08

How to Cite

The influence of the magnetron sputtering regime and the composition of the reaction gas on the structure and properties of ITO films. (2012). Journal of Surface Physics and Engineering, 10(4), 342-349. https://periodicals.karazin.ua/pse/article/view/10074

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