Iliyev, Xalmurat M., Tashkent state technical university, Tashkent, Uzbekistan, Uzbekistan
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East European Journal of Physics No. 3 (2023): East European Journal of Physics - Original Papers
X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique
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East European Journal of Physics No. 2 (2024): East European Journal of Physics - Original Papers
Electrodifusion of Manganese Atoms in Silicon
Abstract pdf