1.
Boboev AY, Makhmudov SA, Makhkamov SK, Yunusaliyev NY, Xotamov MM, Arabboeva MM. Structural Study of Copper Doped Single-Crystal Silicon by Diffusion. East Eur. J. Phys. [Internet]. 2026Jun.10 [cited 2026Jun.11];(2):347-51. Available from: https://periodicals.karazin.ua/eejp/article/view/28659