Ismailov KA, Ismaylov BK, Zikrillaev NF, Kenzhaev ZT, Ollamberganov SZ, Saparov AK. Effect of Nickel Diffusion on Trap States and Interface Quality in Polycrystalline Silicon Structures. East Eur. J. Phys. [Internet]. 2025Dec.8 [cited 2026Jan.6];(4):386-91. Available from: https://periodicals.karazin.ua/eejp/article/view/26725