Boboev AY, Ergashev BM, Yunusaliyev NY, Madaminjonov JS. Electrophysical Nature of Defects in Silicon Caused by Implanted Platinum Atoms. East Eur. J. Phys. [Internet]. 2025Jun.9 [cited 2025Dec.5];(2):431-5. Available from: https://periodicals.karazin.ua/eejp/article/view/26050