Daliev K, Utamuradova S, Khamdamov J, Norkulov SB, Bekmuratov M. Study of Defect Structure of Silicon Doped with Dysprosium Using X-Ray Phase Analysis and Raman Spectroscopy. East Eur. J. Phys. [Internet]. 2024Dec.8 [cited 2025Jan.6];(4):311-2. Available from: https://periodicals.karazin.ua/eejp/article/view/24124