Daliev KS, Utamuradova SB, Khamdamov JJ, Bekmuratov M, Yusupov ON, Norkulov SB, Matchonov KJ. Defect Formation in MIS Structures Based on Silicon with an Impurity of Ytterbium. East Eur. J. Phys. [Internet]. 2024Dec.8 [cited 2024Dec.12];(4):301-4. Available from: https://periodicals.karazin.ua/eejp/article/view/24121