Daliev KS, Utamuradova SB, Bahronkulov ZE, Khaitbaev AK, Hamdamov JJ. Structure Determination and Defect Analysis n-Si<Lu>, p-Si<Lu> Raman Spectrometer Methods. East Eur. J. Phys. [Internet]. 2023Dec.2 [cited 2024May20];(4):193-6. Available from: https://periodicals.karazin.ua/eejp/article/view/22143