Utamuradova SB, Daliev SK, Naurzalieva EM, Utemuratova XY. Investigation of Defect Formation in Silicon Doped with Silver and Gadolinium Impurities by Raman Scattering Spectroscopy. East Eur. J. Phys. [Internet]. 2023Sep.4 [cited 2024Jul.17];(3):430-3. Available from: https://periodicals.karazin.ua/eejp/article/view/22010