Voznyi VI, Sayko MO, Ponomarev AG, Sadovyi SO, Alexenko OV, Shulipa RO. System for Measuring Emittance Characteristics of Ion Sources. East Eur. J. Phys. [Internet]. 2020Aug.13 [cited 2024Dec.4];0(3):46-3. Available from: https://periodicals.karazin.ua/eejp/article/view/15601