Daliev, Khodjakbar S., Sharifa B. Utamuradova, Zavkiddin E. Bahronkulov, Alisher Kh. Khaitbaev, and Jonibek J. Hamdamov. “Structure Determination and Defect Analysis N-Si<Lu>, P-Si<Lu&gt; Raman Spectrometer Methods”. East European Journal of Physics, no. 4 (December 2, 2023): 193-196. Accessed May 20, 2024. https://periodicals.karazin.ua/eejp/article/view/22143.