Turgunov, Nozimjon A., Elmurod Kh. Berkinov, and Raymash M. Turmanova. “The Effect of Thermal Annealing on the Electrophysical Properties of Samples N-Si<Ni,Сu&gt;”. East European Journal of Physics, no. 3 (September 4, 2023): 287-290. Accessed July 27, 2024. https://periodicals.karazin.ua/eejp/article/view/22135.