Normurodov, M. T., O. Ochilov, O. Y. Yuldashev, Z. A. Karshieva, and N. U. Toshboyev. “Resistive Switching Behavior of Si/TiO Thin Films for Non-Volatile Memory Applications”. East European Journal of Physics, no. 2, June 2026, pp. 275-9, doi:10.26565/2312-4334-2026-2-29.