Daliev, K. S., S. B. Utamuradova, Z. E. Bahronkulov, A. K. Khaitbaev, and J. J. Hamdamov. “Structure Determination and Defect Analysis N-Si<Lu>, P-Si<Lu&gt; Raman Spectrometer Methods”. East European Journal of Physics, no. 4, Dec. 2023, pp. 193-6, doi:10.26565/2312-4334-2023-4-23.