M. T. Normurodov, O. Ochilov, O. Y. Yuldashev, Z. A. Karshieva, and N. U. Toshboyev, “Resistive Switching Behavior of Si/TiO Thin Films for Non-Volatile Memory Applications”, East Eur. J. Phys., no. 2, pp. 275-279, Jun. 2026.