[1]
R. R. Blazquez, F. Solis-Pomar, A. Fundora, M. A. Ruiz-Roblez, A. Fragiel, and E. Perez-Tijerina, “Influence of Radio Frequency Magnetron Sputtering Parameters on the Structure and Performance of Al and Al2O3 Thin Films”, East Eur. J. Phys., no. 3, pp. 505-511, Sep. 2025.