M. Davlatov, K. Davranov, X. Dovranov, S. Xusanov, A. Kodirov, and S. Xolikulova, “Structural Characteristics and Optical Properties of SiC Thin Films Produced by the RF-PVD Method”, East Eur. J. Phys., no. 2, pp. 330-334, Jun. 2025.