Daliev, K. S., Utamuradova, S. B., Bahronkulov, Z. E., Khaitbaev, A. K. and Hamdamov, J. J. (2023) “Structure Determination and Defect Analysis n-Si<Lu>, p-Si<Lu&gt; Raman Spectrometer Methods”, East European Journal of Physics, (4), pp. 193-196. doi: 10.26565/2312-4334-2023-4-23.