Iliyev, X. M., Odzhaev, V. B., Isamov, S. B., Isakov, B. O., Ismaylov, B. K., Ayupov, K. S., Hamrokulov, S. I. and Khasanbaeva, S. O. (2023) “X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique”, East European Journal of Physics, (3), pp. 363-369. doi: 10.26565/2312-4334-2023-3-38.