ISMAILOV, K. A.; ISMAYLOV, B. K.; ZIKRILLAEV, N. F.; KENZHAEV, Z. T.; OLLAMBERGANOV, S. Z.; SAPAROV, A. K. Effect of Nickel Diffusion on Trap States and Interface Quality in Polycrystalline Silicon Structures. East European Journal of Physics, n. 4, p. 386-391, 8 Dec. 2025.