ILIYEV, X. M.; ODZHAEV, V. B.; ISAMOV, S. B.; ISAKOV, B. O.; ISMAYLOV, B. K.; AYUPOV, K. S.; HAMROKULOV, S. I.; KHASANBAEVA, S. O. X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique. East European Journal of Physics, n. 3, p. 363-369, 4 Sep. 2023.