Foziljonov, M., ErgashevB. М., Yunusaliyev, N. Y., Norbutayev, M., & Orinboyeva, K. (2026). TCAD-Based Capacitance Analysis for Identifying Longitudinally Localized Oxide-Trapped Charge in SOI FinFETS. East European Journal of Physics, (3), 286-291. https://doi.org/10.26565/2312-4334-2026-3-23