Ismailov, K. A.; Ismaylov, B. K.; Zikrillaev, N. F.; Kenzhaev, Z. T.; Ollamberganov, S. Z.; Saparov, A. K. Effect of Nickel Diffusion on Trap States and Interface Quality in Polycrystalline Silicon Structures. East Eur. J. Phys. 2025, 386-391.