(1)
Blazquez, R. R.; Solis-Pomar, F.; Fundora, A.; Ruiz-Roblez, M. A.; Fragiel, A.; Perez-Tijerina, E. Influence of Radio Frequency Magnetron Sputtering Parameters on the Structure and Performance of Al and Al2O3 Thin Films. East Eur. J. Phys. 2025, 505-511.