Ismailov, K.A., Ismaylov, B.K., Zikrillaev, N.F., Kenzhaev, Z.T., Ollamberganov, S.Z. and Saparov, A.K. 2025. Effect of Nickel Diffusion on Trap States and Interface Quality in Polycrystalline Silicon Structures. East European Journal of Physics. 4 (Dec. 2025), 386-391. DOI:https://doi.org/10.26565/2312-4334-2025-4-36.