[1]
Isaev, M., Khudayberdieva, A., Mamatkulov, M., Asatov, U. and Kodirov, S. 2024. The Surface Layer Morphology of Si<Cr> Samples.
East European Journal of Physics
. 4 (Dec. 2024), 297-300. DOI:https://doi.org/10.26565/2312-4334-2024-4-32.