Daliev, K., Utamuradova, S., Khamdamov, J., Norkulov, S.B. and Bekmuratov, M. 2024. Study of Defect Structure of Silicon Doped with Dysprosium Using X-Ray Phase Analysis and Raman Spectroscopy. East European Journal of Physics. 4 (Dec. 2024), 311-321. DOI:https://doi.org/10.26565/2312-4334-2024-4-35.