Iliyev, X.M., Odzhaev, V.B., Isamov, S.B., Isakov, B.O., Ismaylov, B.K., Ayupov, K.S., Hamrokulov, S.I. and Khasanbaeva, S.O. 2023. X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique. East European Journal of Physics. 3 (Sep. 2023), 363-369. DOI:https://doi.org/10.26565/2312-4334-2023-3-38.